Work

PCB defect detection based on YOLOv10 algorithm with multi-scale mixed attention improvement mechanism

Year: 2025

Type: conference-paper

Source: IEEE International Conference on Electronic Technology, Communication and Information (ICETCI)

DOI: 10.1109/icetci64844.2025.11084060

Author: Xuan Ji

Institution: Wuhan University of Technology

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4412623856

FWCI: 2.526

Cites: 16

Cited by: 1

Related to: 10