Work

Improving PCB Defect Detection with KAN-YOLO: A Knowledge-Enhanced Feature Fusion Approach

Year: 2025

Type: conference-paper

Source: IEEE International Conference on Electronic Technology, Communication and Information (ICETCI)

DOI: 10.1109/icetci64844.2025.11084156

Authors: Dingshu Fan, Hongye Wu

Institution: Beijing University of Posts and Telecommunications

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4412624000

FWCI: 7.362

Cites: 11

Cited by: 3

Related to: 10