Work

Remaining Useful Life Prediction through Gradient Boosting Transfer Learning for Semiconductor Digital Twins

Year: 2025

Type: conference-paper

Source: IEEE International Conference on Digital Twins and Parallel Intelligence (DTPI)

DOI: 10.1109/dtpi65196.2025.11088878

Authors: Tori Wright, Madelyn Upthegrove, Sean Mondesire

Institution: University of Central Florida

Language: English

Topic: Reliability and Maintenance Optimization

Subfield: Safety, Risk, Reliability and Quality

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4412624117

FWCI: 9.239

Cites: 14

Cited by: 3

Related to: 10