Work

High-Precision Thin Film Thickness Measurement System Based on Pcap01

Year: 2025

Type: conference-paper

Source: International Conference on Electronic Engineering and Information Systems (EEISS)

DOI: 10.1109/eeiss65394.2025.11085910

Authors: Yunzhi Shi, Yawen Li, Benxiao Cai

Institution: Hangzhou Dianzi University

Language: English

Topic: Sensor Technology and Measurement Systems

Subfield: Computer Networks and Communications

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4412624323

FWCI:

Cites: 11

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Related to: 10