Work

Circuit board defect detection method based on improved YOLOv10 algorithm

Year: 2025

Type: conference-paper

Source: IEEE International Conference on Electronic Technology, Communication and Information (ICETCI)

DOI: 10.1109/icetci64844.2025.11084220

Author: Hanwen Li

Institution: Nanjing University of Aeronautics and Astronautics

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4412624656

FWCI:

Cites: 18

Cited by:

Related to: 10