Work

Analysis of the Impact of Supply Voltage Variation on the Characteristics of SRAM-based PUFs

Year: 2025

Type: article

Source: Jouranl of Information and Security

DOI: 10.33778/kcsa.2025.25.2.091

Authors: 국립한밭대학교 반도체시스템공학과 조교수, Moon-Seok Kim, Seung-Bae Jeon, Jun-Young Park

Language: English

Topic: Physical Unclonable Functions (PUFs) and Hardware Security

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4412729303

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