Work

An Experimental Study on Hot-Hole Injection (HHI) in Floating-Gate (FG) Flash Memory

Year: 2025

Type: conference-paper

Source: Silicon Nanoelectronics Workshop (SNW)

DOI: 10.23919/snw65111.2025.11097234

Authors: Chang Chen, Yang Feng, Jixuan Wu, Jing Liu, Junyu Zhang, Xuepeng Zhan, Jiezhi Chen

Institutions: Shandong University, Chinese Academy of Sciences, Institute of Microelectronics

Language: English

Topic: Semiconductor materials and devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: National Natural Science Foundation of China

Award: G2893905287

OpenAlex ID: W4412803120

FWCI:

Cites: 5

Cited by:

Related to: 10