Work

Synergistic Impact of Random Phase Distribution and Polarization Strength Variations on FeFET Across Grain Sizes and Ferroelectric Percentages

Year: 2025

Type: conference-paper

Source: Silicon Nanoelectronics Workshop (SNW)

DOI: 10.23919/snw65111.2025.11097262

Authors: Yi-Ming Tseng, Vita Pi-Ho Hu

Institution: National Taiwan University

Language: English

Topic: Ferroelectric and Negative Capacitance Devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4412803232

FWCI:

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