Work

Total Ionizing Doses Effects on MOSFET, FinFET, and GAAFET After Co-60 Radiation Exposure

Year: 2025

Type: conference-paper

Source: Silicon Nanoelectronics Workshop (SNW)

DOI: 10.23919/snw65111.2025.11097251

Authors: Jing-Lin Zheng, Dun-Bao Ruan, Kuei-Shu Chang-Liao, Shang-Hua Hsu

Institutions: National Tsing Hua University, Fuzhou University

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4412803428

FWCI:

Cites: 2

Cited by:

Related to: 10