Work

Performance Analysis of Roboflow 3.0 and YOLO-NAS in PCB Defect Detection Compared to YOLOv9 and RT-DETR Using Augmented Image Dataset

Year: 2025

Type: conference-paper

Source: International Conference on Control and Robotics Engineering (ICCRE)

DOI: 10.1109/iccre65455.2025.11093496

Authors: Jared Solano Aleman, Alicia María Reyes-Duke

Institution: Central American Technological University

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4412803503

FWCI: 2.526

Cites: 12

Cited by: 1

Related to: 10