Reliability Analysis of CFETs Under Various NBTI Conditions
Year: 2025
Type: conference-paper
Authors: Hsiang-Ting Kung, Narasimhulu Thoti, Hannu-Pekka Komsa, Ying-Tsan Tang
Institutions: National Central University, University of Oulu
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4412803525