Work

Machine Learning-Driven Modeling for Fast and Accurate Z-Interference Estimation in 3D NAND Scaling

Year: 2025

Type: conference-paper

Source: Silicon Nanoelectronics Workshop (SNW)

DOI: 10.23919/snw65111.2025.11097230

Authors: Hyeon Seo Yun, Jong Kyung Park

Institution: Seoul National University of Science and Technology

Language: English

Topic: Semiconductor materials and devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: Ministry of Trade, Industry and Energy

OpenAlex ID: W4412803531

FWCI:

Cites: 4

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Related to: 10