Work

BEOL-Compatible IGZTO Thin-Film Transistors with Ultra-High Positive Bias Stress Stability for Advanced Electronics

Year: 2025

Type: conference-paper

Source: Silicon Nanoelectronics Workshop (SNW)

DOI: 10.23919/snw65111.2025.11097214

Authors: Kai Chen, Xiaonan Wu, Ran Cheng, Rui Zhang, Junkang Li, Yunlong Li

Institution: Zhejiang University

Language: English

Topic: Thin-Film Transistor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4412803773

FWCI: 2.358

Cites: 6

Cited by: 1

Related to: 10