Work

Low-Voltage Electron Microscopy (LVEM): Part I — Benchtop and Compact TEMs with Heightened Contrast for Soft Materials

Year: 2025

Type: article

Source: Microscopy Today

DOI: 10.1093/mictod/qaaf048

Authors: Daniela Vieira, Emad Shahnam, Jaromir Bacovsky, Jared Lapkovsky

Institution: Delong Instruments (Czechia)

Language: English

Topic: Advanced Electron Microscopy Techniques and Applications

Subfield: Structural Biology

Field: Biochemistry, Genetics and Molecular Biology

Domain: Life Sciences

Open Access status: closed

OpenAlex ID: W4412834664

FWCI: 1.03

Cites: 20

Cited by: 3

Related to: 10