An Improved Wiener-Based Remaining Useful Life Prediction Approach With Reduced Uncertainty for High-Power IGBT Modules
Year: 2025
Type: article
Authors: Hengzhi Liu, He-Sheng Zhang, Yicong Tang
Institution: Beijing Jiaotong University
Language: English
Subfield: Safety, Risk, Reliability and Quality
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
Awards: G3113527392, G7477848995
OpenAlex ID: W4412939927