Work

Impact of Accelerated Life Testing on the Metrological Performance of Commercial MEMS Accelerometers

Year: 2025

Type: conference-paper

Source: IEEE International Instrumentation and Measurement Technology Conference

DOI: 10.1109/i2mtc62753.2025.11079002

Authors: Marco Carratù, Vincenzo Gallo, Valter Laino, Paolo Sommella, Antonio Pietrosanto, Lorenzo Ciani, Roberto Singuaroli, Gabriele Patrizi

Institutions: University of Salerno, University of Florence

Language: English

Topic: Inertial Sensor and Navigation

Subfield: Aerospace Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4412962809

FWCI: 2.656

Cites: 25

Cited by: 1

Related to: 10