A 3nm FinFET 563kbit 35.5Mbit/mm2 Dual-Rail SRAM with 3.89pJ/Access High Energy Efficient andμW/Mbit 1-Cycle Latency Low-Leakage Mode
Year: 2025
Type: conference-paper
Institution: Taiwan Semiconductor Manufacturing Company (Taiwan)
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4412963232
