Work

AI for Root Cause Analysis & Visual Inspection

Year: 2025

Type: conference-paper

Source: International Conference on Control, Communication and Computing (ICCC)

DOI: 10.1109/iccc64910.2025.11077313

Authors: D. Kavitha, M. Karthiga, J. S. Srinita

Institution: Coimbatore Institute of Technology

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4412963522

FWCI:

Cites: 7

Cited by:

Related to: 10