Work

First Direct Observation of Two Different Hydrogen-Related Processes Corresponding to the Negative V TH Shift Under PBTI Stress in IGZO Transistors by Pd Hydrogen Spillover

Year: 2025

Type: conference-paper

DOI: 10.23919/vlsitechnologyandcir65189.2025.11075056

Authors: Zhiyu Lin, Lu Kang, Yi Zhang, Shiheng Lu, Tianning Cui, Liankai Zheng, Jinxiu Zhao, Xiuyan Li, Xin Zhao, Ying Wu, Jeffrey Xu, Mengwei Si

Institutions: Shanghai Jiao Tong University, Huawei Technologies (China)

Language: English

Topic: Thin-Film Transistor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4412964310

FWCI: 9.282

Cites: 7

Cited by: 4

Related to: 10