Work

A 1.7 pJ/bit 10 MHz Calibration-Free PVT Variation and Mismatch Tolerant Latch-Based True Random Number Generator in 4 nm FinFET

Year: 2025

Type: conference-paper

DOI: 10.23919/vlsitechnologyandcir65189.2025.11075211

Authors: Jaehoon Lee, Jongmi Lee, Yelim Youn, Yong Lim, Dongyeon Hong, Bogyeong Kang, Sangmin Yoo, Jae-Yoon Sim

Institutions: Pohang University of Science and Technology, Samsung (South Korea), Samsung Electronics (South Korea)

Language: English

Topic: Physical Unclonable Functions (PUFs) and Hardware Security

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4412965173

FWCI: 7.426

Cites: 1

Cited by: 8

Related to: 10