Work

Electrical Resistance Tomography for the investigation of memristive nanowire networks

Year: 2025

Type: conference-paper

Source: IEEE International Instrumentation and Measurement Technology Conference

DOI: 10.1109/i2mtc62753.2025.11079143

Authors: Alessandro Cultrera, Gianluca Milano, Carlo Ricciardi, Luca Callegaro

Institutions: Istituto Nazionale di Ricerca Metrologica, Politecnico di Torino

Language: English

Topic: Electrical and Bioimpedance Tomography

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: HORIZON EUROPE Framework Programme

OpenAlex ID: W4412965488

FWCI:

Cites: 17

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Related to: 10