3D NOR-Type FeFETs with Record Endurance of 10 11 , Fast Erase of 50 ns, and Immediate Read-After-Write for In-Memory Learning
Year: 2025
Type: conference-paper
Authors: Yuejia Zhou, Runteng Zhu, Wenpu Luo, Xiaojian Xu, Siyuan Qi, Zhiyuan Ning, Liang Chen, Hanyong Shao, Kechao Tang, Ru Huang
Institution: Peking University
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4412965800