A Prototype 16Mbit RRAM on 55nm BCD with 56% Compact-Area Wordline Driver and Constant Write-Current Scheme for Automotive 150°C Operation
Year: 2025
Type: conference-paper
Authors: Kohei Santo, Masayoshi Nakayama, Reiji Mochida, Hitoshi Suwa, Motoki Tamura, Atsuo Mangyo, Koji Nii, Yu-Cheng Lin, C.F. Wang, Wu-Chin Tsai, Y.D. Chih, Tsung-Yung Jonathan Chang
Institution: Taiwan Semiconductor Manufacturing Company (Taiwan)
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4412966210