Work

Improving Irradiation Reliability of 4H-SiC 1200V LDMOS and 20V CMOS Logic Circuits with Leakage Current Blocking Technology

Year: 2025

Type: conference-paper

DOI: 10.23919/vlsitechnologyandcir65189.2025.11074887

Authors: Jie Ma, Yong Gu, Mengyao Zhao, Tianchun Nie, Jiaxing Wei, Sheng Li, Runhua Huang, Song Bai, Siyang Liu, Weifeng Sun, Long Zhang

Institution: Southeast University

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4412966782

FWCI: 4.717

Cites: 1

Cited by: 2

Related to: 10