Research on proficiency testing methods for radiated spurious emissions of wireless communication devices
Year: 2025
Type: conference-paper
DOI: 10.1117/12.3070404
Authors: Chuanzi Deng, Tong Wu, Yao Yao
Institution: National Institute of Metrology
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4412970112
