Battbee: A Novel Equivalent Circuit Model to Capture Thermal Runaway Induced by Internal Short Circuits
Year: 2025
Type: conference-paper
Authors: Sangwon Kang, Huazhen Fang
Institution: University of Kansas
Language: English
Subfield: Automotive Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4412987372
