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A Current Variation-Based Monitoring Method for Microwave-Induced Damage Effects in Low-Noise Amplifiers

Year: 2025

Type: conference-paper

DOI: 10.1109/eicct65471.2025.11099757

Authors: Tao Yan, Yibo Zhang, Zhiqiang Yang, Rongwei Zhang

Institutions: Xi'an Jiaotong University, Northwest Institute of Nuclear Technology

Language: English

Topic: Electromagnetic Compatibility and Noise Suppression

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4413010374

FWCI:

Cites: 9

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Related to: 10