Work

Verification of the Consistency of Thermal Resistance Measurement of Heat Source-Temperature Measurement Separated Chips

Year: 2025

Type: conference-paper

DOI: 10.1109/eicct65471.2025.11099809

Authors: Haibing Li, Hui Zhu, Yuanjie Lv, Shiwei Feng, Xiaozhuang Lu, ShiJie Pan, Jiahe Wan

Institutions: Beijing University of Technology, Hebei Semiconductor Research Institute

Language: English

Topic: GaN-based semiconductor devices and materials

Subfield: Condensed Matter Physics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4413018126

FWCI:

Cites: 13

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Related to: 10