Design of a High-Reliability STT-MRAM Read Circuit Based on 40nm Process
Year: 2025
Type: conference-paper
Authors: Wangqian Gao, Tao Jiang, Yi Lu, Aiming Ji, Lijun Zhang
Institution: Soochow University
Language: English
Subfield: Atomic and Molecular Physics, and Optics
Field: Physics and Astronomy
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4413018497