Lifetime Prediction and Stability Analysis of TMR Chips Based on a Modified Arrhenius-Eyring Model
Year: 2025
Type: conference-paper
Authors: Hao Yu, Shuai Yuan, WenZhi Chang, YanPeng Gong
Institution: China Electric Power Research Institute
Language: English
Subfield: Safety, Risk, Reliability and Quality
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
Funder: State Grid Corporation of China
OpenAlex ID: W4413018525