Work

Regularities of X-ray Transfer in Doped Multicomponent Semiconductors for Dosimetry

Year: 2025

Type: article

Source: Russian Microelectronics

DOI: 10.1134/s1063739725600281

Authors: S. M. Asadov, S. N. Mustafaeva, V. F. Lukichev

Institutions: Azerbaijan State Oil and Industry University, Ministry of Science and Education Republic of Azerbaijan, Institute of Catalysis and Inorganic Chemistry, Institute of Physics, Fizika İnstitutu Publik Hüquqi Şəxs, Russian Academy of Sciences

Language: English

Topic: Advanced Semiconductor Detectors and Materials

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4413022868

FWCI: 0.46

Cites: 35

Cited by: 2

Related to: 10