Measurement of in-plane thermal diffusivity of thin film using a regression methodology based on Bayesian optimization algorithm
Year: 2025
Type: article
Source: Review of Scientific Instruments
DOI: 10.1063/5.0285181
Authors: Maochao Lv, Qinmeng Jiang, Hui Liu, Yanhui Zhang, Jie Yang, Jianli Wang
Language: English
Subfield: Mechanics of Materials
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
Award: G659125975
OpenAlex ID: W4413041092
