Work

Empirical Finfet Cryo-Model Oriented to Integrated Circuits Design

Year: 2025

Type: conference-paper

Source: International Conference on IC Design and Technology

DOI: 10.1109/icicdt65192.2025.11078117

Authors: Ifra Saeed, Gianni Bosi, Ciro Esposito, Federico D'Aniello, Edoardo Charbon, Andrea Baschirotto, Valeria Vadalà

Institutions: University of Milano-Bicocca, École Polytechnique Fédérale de Lausanne

Language: English

Topic: Advancements in Semiconductor Devices and Circuit Design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4413068186

FWCI: 6.961

Cites: 17

Cited by: 3

Related to: 10