Work

Bayesian Hierarchical Assessment of Proficiency Test Item Stability in Radiated Disturbance Proficiency Testing

Year: 2025

Type: conference-paper

Source: International Conference on Electronics, Circuits and Information Engineering (ECIE)

DOI: 10.1109/ecie65947.2025.11087025

Authors: Chuanzi Deng, Wei Tang, Tong Wu, Qingfei Shen

Institution: National Institute of Metrology

Language: English

Topic: Electromagnetic Compatibility and Measurements

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4413096743

FWCI:

Cites: 10

Cited by:

Related to: 10