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Deep Learning Algorithms for Real Time Quality Control in Automated Production

Year: 2024

Type: conference-paper

DOI: 10.1109/ariia63345.2024.11051585

Authors: Satish Kumar Kalhotra, Sunil Kr Pandey, M Vijayasanthi, Udit Mamodiya, Kamesh Yadav, Subarno Bhattacharyya

Institutions: Rajiv Gandhi University, Poornima University, Uttaranchal University, O. P. Jindal Global University

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4413098676

FWCI:

Cites: 5

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Related to: 10