Work

Measurement technique for scattering characteristics of surface defects of optical components

Year: 2025

Type: conference-paper

Source: Optical Technology and Measurement for Industrial Applications Conference (OPTM)

DOI: 10.1117/12.3072252

Authors: Jingyao Hou, Weiguo Liu, Shun Zhou, Xueping Sun, Jin Cheng

Language: English

Topic: Surface Roughness and Optical Measurements

Subfield: Computational Mechanics

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4413105384

FWCI: 0.982

Cites:

Cited by: 1

Related to: 10