Work

TAFF-YOLO: An Enhanced YOLO Model With Transformer and Attention Feature Fusion for Chip Internal Defect Detection

Year: 2025

Type: article

Source: IEEE Transactions on Semiconductor Manufacturing

DOI: 10.1109/tsm.2025.3597147

Authors: Wenxin Niu, Jianqiang Mei, Dawei Zhang, Yue Li, Fan Jia, Weixiang Du

Institution: Tianjin University of Technology and Education

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

Funders: Science and Technology Department of Gansu Province, Shantou Science and Technology Project

Awards: G4021699099, G6073022721

OpenAlex ID: W4413120392

FWCI: 1.556

Cites: 14

Cited by: 3

Related to: 10