Work

A Middle Underfill L-Standard Design for Highly Impedance Continuity in Four-Port Probe De-Embedding Calibration

Year: 2025

Type: article

Source: IEEE Sensors Journal

DOI: 10.1109/jsen.2025.3594824

Authors: Zhanjun Huang, Hui Li, Litao Ruan, Xinxin Tian, Shan Xue, Jun Luo, Guoguang Lu, Zhizhe Wang, Weiheng Shao

Institutions: Northwestern Polytechnical University, China Electronic Product Reliability and Environmental Test Institute

Language: English

Topic: Electromagnetic Compatibility and Measurements

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funders: National Natural Science Foundation of China, Natural Science Foundation of Guangdong Province, Fundamental Research Funds for the Central Universities

Awards: G1343838835, G2378647363, G4301419869, G5623590144, G7676473098

OpenAlex ID: W4413120587

FWCI: 0.231

Cites: 25

Cited by: 1

Related to: 10