ABF-YOLO: A Fine-Grained PCB Defect Detection Framework Integrating Axial Attention and Bidirectional Feature Fusion
Year: 2025
Type: article
Authors: Xiaoyao He, Mingyang Xie
Institution: Nanjing University of Aeronautics and Astronautics
Language: English
Subfield: Industrial and Manufacturing Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
Awards: G1339973214, G2109703515
OpenAlex ID: W4413120604