Point-Cap: An Efficient Model for Chip-Scale Interconnect Capacitance Extraction
Year: 2025
Type: conference-paper
Authors: Weizhe Zhang, Yaohui Han, Lihao Liu, Qunsong Ye, Fan Yang, Tinghuan Chen
Institutions: Chinese University of Hong Kong, Shenzhen, Fudan University
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4413120658
