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Fe-NVSim: An Extended NVSim for Emerging FeFET-based Embeded Memory Simulation

Year: 2025

Type: conference-paper

Source: International Symposium of Electronics Design Automation (ISEDA)

DOI: 10.1109/iseda65950.2025.11100795

Authors: Kai Chen, Junfeng Tan, Bo Li, Xiguang Wu, Kai Xiong, Hongrui Zhang, Bing Chen, Yan Liu, Genquan Han

Institution: Xidian University

Language: English

Topic: Ferroelectric and Negative Capacitance Devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: Fundamental Research Funds for the Central Universities

OpenAlex ID: W4413120673

FWCI:

Cites: 19

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Related to: 10