Work

SD-CED: Detecting Compromised Devices in Software Defined Consumer Electronics Environment

Year: 2025

Type: article

Source: IEEE Transactions on Consumer Electronics

DOI: 10.1109/tce.2025.3596931

Authors: Chandan Kumar, Bipal Khanal, Md. Sarfaraj Alam Ansari

Institution: National Institute of Technology Sikkim

Language: English

Topic: Network Security and Intrusion Detection

Subfield: Computer Networks and Communications

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4413120737

FWCI: 1.318

Cites: 36

Cited by: 3

Related to: 10