Work

Characterization of Low-Frequency Noise in Polycrystalline Silicon Thin-Film Transistors Under Hot-Carrier Stress

Year: 2025

Type: article

Source: IEEE Transactions on Electron Devices

DOI: 10.1109/ted.2025.3594322

Authors: Bo Wang, Meng Zhang, Guanming Zhu, Zhendong Jiang, Lu Lei, Lanrong Zou, Man Wong, Hoi-Sing Kwok

Institutions: Shenzhen University, Peking University, Hong Kong University of Science and Technology

Language: English

Topic: Thin-Film Transistor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: National Natural Science Foundation of China

Awards: G301367882, G3097323869

OpenAlex ID: W4413120792

FWCI: 0.451

Cites: 41

Cited by: 2

Related to: 10