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Characterization Approaches to Reduce Process Variation Dependencies for on-Wafer Power Calibration Transfer Devices in Bi/CMOS Technologies

Year: 2025

Type: conference-paper

Source: IEEE MTT-S International Microwave Symposium digest

DOI: 10.1109/ims40360.2025.11103834

Authors: Zerui Gao, Carmine de Martino, Marco Pelk, Steffen Lehmann, Marco Spirito

Institutions: Delft University of Technology, GlobalFoundries (Germany)

Language: English

Topic: Radio Frequency Integrated Circuit Design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4413121997

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Cites: 6

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Related to: 10