Differential-Mode Characterization of Multi-Port Passives up to 170GHz Using Independent Single-Ended Two-Port Measurements
Year: 2025
Type: conference-paper
Abstract: Fully differential measurements in D-band$(110-170 \text{GHz})$are challenging due to the absence of differential multi-port measurement equipment. This work presents a methodology to enable full differential-mode characterization up to 170 GHz exploiting consecutive single-ended measurements. The measurement methodology is experimentally validated by multi-sample characterization of a differential 4-port quadrature hybrid designed in 22 nm FDSOI technology.
Institutions: Eindhoven University of Technology, NXP (Netherlands)
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: green
OpenAlex ID: W4413122001
