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Unsupervised Defect Detection Based on Self-Supervised Transformers

Year: 2025

Type: conference-paper

Source: International Symposium of Electronics Design Automation (ISEDA)

DOI: 10.1109/iseda65950.2025.11100828

Authors: Qianqian Ye, Hui Jiang

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4413122145

FWCI: 2.448

Cites: 6

Cited by: 1

Related to: 10