Work

Optical metrology for mass production of microLED displays & wafers

Year: 2025

Type: conference-paper

DOI: 10.1117/12.3062592

Authors: Roland Schanz, Tobias Steinel

Language: English

Topic: GaN-based semiconductor devices and materials

Subfield: Condensed Matter Physics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4413124540

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