Inspection of linear axicon surface by double-pass interferometry
Year: 2025
Type: conference-paper
DOI: 10.1117/12.3061729
Authors: Huy Vu, Joohyung Lee
Institution: Seoul National University of Science and Technology
Language: English
Subfield: Computer Vision and Pattern Recognition
Field: Computer Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4413124750