Reference calibration of white-light interferometers for testing advanced x-ray surfaces with atomic accuracy (Conference Presentation)
Year: 2025
Type: conference-paper
DOI: 10.1117/12.3062162
Authors: Zubo Hu, Shuai Xue, YunFeng Mao, Antong Huang, Xibo Gao
Institution: National University of Defense Technology
Language: English
Subfield: Computer Vision and Pattern Recognition
Field: Computer Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4413124769