Work

Development of dual-wavelength polarization interferometer for profile measurement of rough surface

Year: 2025

Type: conference-paper

DOI: 10.1117/12.3062342

Authors: Zhi-Cheng Wang, Ju-Yi Lee

Institution: National Central University

Language: English

Topic: Optical measurement and interference techniques

Subfield: Computer Vision and Pattern Recognition

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4413124772

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